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X-ray imaging of nanoscale structures and processes.

XM-1, a soft x-ray full-field microscope.

XM-1: The world's highest resolution zoneplate microscope.

XM-1 combines: spatial resolution approaching 10 nm, elemental specificity, 70 ps temporal resolution (set by the bunch length of the x-ray pulses), and high sensitivity to spin configurations (via dichroism effects with polarized x-rays) making it a unique analytical tool for nanoscience research. Every day, scientists working in areas such as spintronics, nanoscale materials science, x-ray optics and environmental sciences come to XM-1 to unlock nanoscale properties that are challenging or impossible to see in other ways.

XM-1 schematic

XM-1 specifications

Source	Bend magnet
Energy range	500-1300 eV
Monochromator	Zone-plate linear
Flux	Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW (ALS at 1.9 GeV, 400 mA)
Spectral resolution (E/ΔE)	500-700
Spatial resolution	Typical 25 nm (best value 10 nm)
Field of view	15 µm single field; virtually unlimited larger areas can be tiled together like a mosaic
Detector	Back-thinned 2048- x 2048-pixel CCD camera
Equipment	Various fast electronic pulsers for spin dynamics, fast sampling oscilloscope, polarization selecting aperture

XM-1 sample information

Format	Thin films deposited typically on Si3N4 membrane (similar to TEM substrates) or other x-ray-transparent substrates
Preparation	Sample dependent
Environment	External magnetic fields up to 5 kOe in beam direction and 2 kOe along the sample plane; tilted sample holder for in-plane magnetized samples; He at atmospheric pressure, wet or dry

Visit the XM-1 homepage.

Visit cxro.lbl.gov/BL612 for more information about XM-1.

CXRO's XM-1 team.

Explore the Center for X-Ray Optics

Contact CXRO

General Information
Administration and Budget
Personnel
Beamlines and Facilities

CXRO Documents

X-Ray Data Booklet
CXRO Intro Booklet
CXRO Logos

Other Resources

LBNL
Materials Science Division
U.S. Department of Energy