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ARM, Inc.
4965 Preston Park Blvd, Suite 650Plano, TX, 75093
USA
tele: 1-214-291-0580
Ken.Havens@arm.com
arm.com
EECatalog Tech Videos
ARM TechCon Videos: Interview with Ian Drew. (Part 1: Servers)
ARM TechCon Videos: Interview with Ian Drew. (Part 2: 'mbedding' the IoT)
Why Don't Software Programmers like Comments?
Why IP Providers Need the New 1149.1/JTAG
Imec’s mm Wave Motion Sensing Technology
Mentor’s Wally Rhines – Learning Curve; Golden 28nm, IoT Innovation and Systems Engineering
Code integration facilitates chip innovation
Collaboration is the key to chip innovation
Innovating with Statistical Analysis
RTL Signoff turns competitive
GigOptix-40G DQPSK Demonstration
Cost-Effective Millimeter Signal Analysis Approaches | Agilent Technologies
SDC Management and Verification: What's Missing?
John Blyler Interview on ChipEstimate.TV
Synopsys Discusses its New DDR4 Memory Interface IP
IMS 2012 Keynote on Integrating Design and Test
Paul Estrada discusses the benefits of integrated analog FastSPICE with Tanner EDA tool suite
Semicon West - Jim Feldhan interview
Semicon West - Karen Lightman interview
Semicon West 2012 - Ludo Deferm interview
3D EDA Readiness at Cadence
KLA-Tencor 450mm-Capable Surfscan® SP3 Systems
Chipmakers Adopt Cymer’s SmartPulse™
Chris Mack goes deep (UV)
Power and Reliability Sign-off
"New Verdi³ and the Verdi Interoperability Apps (VIA)", Mark Milligan, VP of Marketing, Springsoft
“What is Driving Lint Usage in Complex SOCs?”, Jim Foley, R&D Manager, Real Intent
"Real Intent Demos, and CDC Issues", Jay Littlefield, Sr. FAE
DAC 2012 Update on AMIQ's DVT IDE - New RTL Design Work Flow Support
Cadence Pattern Matching and DFM signoff success
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Featured White Papers
Analog Signal Conditioning for Accurate Measurements
Q: Should I put some sort of circuit between my sensor and an analog-to-digital converter?
A: Yes. You probably need some signal conditioning. The explanation below goes on for a bit, but stay with it and you'll understand what you need and why you need it.USB 3.1: Evolution and Revolution
USB-IF Worldwide Developers Days introduced developers to the new USB 3.1 specification. This white paper digs deep into 10G USB 3.1 to clarify the evolutionary and revolutionary changes in the specification.
7 Key Considerations For Effective Chip-Package Thermal Co-Design
Chip-package co-design is important for several reasons. Designing a large high power die, e.g. a System-on-Chip (SoC) without considering how to get the heat out is likely to lead
Ultra Low-Power 9D Sensor Fusion Implementation: A Case Study
Today, the ability to track the orientation or position of a device is a common feature in many portable and wearable products. Computing the orientation is a non-trivial task that converts inputs from multiple motion sensors into accurate position information. This computation is called sensor fusion and it eliminates inaccuracies from noisy sensor inputs. This paper shows how using DesignWare® ARC® Processor EXtension (APEX) technology improves cycle count and energy consumption for a power-efficient implementation of a 9D fusion algorithm on an IP subsystem.
10 Tips for Streamlining PCB Thermal Design… A High-Level ‘How To’ Guide
Many aspects of a PCB’s performance are determined during detailed design. Thermal issues with the PCB design are largely ‘locked in’ during the component (i.e. chip package)
10 Tips for Predicting Component Temperatures… A High-Level ‘How To’ Guide
Recently, physics-based reliability prediction has related electronic assembly failure rates to the rate and magnitude of temperature change over an operational cycle, both of which are influenced by steady-state operating temperature. Whether the intention is to increase reliability, or improve performance, accurate prediction of component temperatures helps meet design goals.
12 Key Considerations in Enclosure Thermal Design… A High-Level ‘How To’ Guide
A natural focus when designing electronics products are, well the electronics. The electronics itself however, needs to work within some kind of enclosure, and must be designed with the enclosure in mind. Cooling is a system issue, which is why we advocate a top-down approach, starting at the enclosure level.
Upcoming Events
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International Electron Devices Meeting (IEDM)
San Francisco, CA December 13-17, 2014
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DesignCon
Santa Clara, CA January 27-30, 2015
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International Solid State Circuits Conference (ISSCC)
San Francisco, CA February 22-26, 2015
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Design and Verification Conference (DVCON)
San Jose, CA March 2-5, 2015
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Design, Automation and Test in Europe (DATE)
Grenoble, France March 9-13, 2015
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Burn-in & Test Strategies Workshop
Mesa, Arizona March 15-18, 2015
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Deisgn Automation Conference (DAC)
San Francisco, CA June 7-11, 2015
EECatalog Tech Videos
ARM TechCon Videos: Interview with Ian Drew. (Part 2: 'mbedding' the IoT)
Embedded editor Chris A. Ciufo chats with Ian Drew, CMO, ARM. In part 2, the guys discuss: ARM's mbed/mbed OS and Cortex-M7; the easy path to the IoT is made easy by ARM's new mbed
ARM TechCon Videos: Interview with Ian Drew. (Part 1: Servers)
Embedded editor Chris Ciufo chats with Ian Drew, CMO, ARM. ARM's move into 64-bit servers with HP's recent “Moonshot” announcement; how the IoT grows from the enterprise and handsets; and ARM partners' complete infrastructure for servers.
Why Don't Software Programmers like Comments?
Cristian Amitroaie, CEO of Amiq, talks with John Blyler about Specador, a automated HTML documentation tool for chip design and verification engineers. This tool generates meaningful documentation even from poorly documented source code, as it actually compiles the code and can generate cross-link class inheritance trees, design hierarchies, and diagrams. The need for this functionality lead to an interesting discussion about the software programming process and why programmers rarely document their own work.
Why IP Providers Need the New 1149.1/JTAG
Intellitech's CEO CJ Clark explains why the latest JTAG update brings much needed capabilities to IP providers and IC developers alike.
Imec’s mm Wave Motion Sensing Technology
Motion sensing applications with mm wave technology at Imec is the topic of this interview between Liesbet Van der Perre, Imec Program Director of Wireless Communication, and John Blyler, VP and CCO at Extension Media.
Mentor’s Wally Rhines – Learning Curve; Golden 28nm, IoT Innovation and Systems Engineering
Wally Rhines, Chairman and CEO of Mentor Graphics, talks about Moore's Law in light of the Learning Curve; 28nm as the golden node; critical need for IoT innovations; and why systems engineering often fails.
Collaboration is the key to chip innovation
In our third interview at the Design Automation Conference in Austin, Texas, John Blyler of Chip Design Magazine talks with Dennis Bibeau of Infotech about the importance of collaboration across all disciplines in achieving innovative chip design.