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  T&MW announces winners of 2012 Best in Test awards

  
  At a ceremony held January 31 in Santa Clara, CA, the editors of Test & Measurement World recognized the winners of the 2012 Best in Test and Test of Time awards and also announced that Brad Davis of Broadcom was voted the Test Engineer of the Year.  More

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• Keyence adds line-scan option to XG-8000 vision system

  With simultaneous operation of up to eight line-scan cameras and high-speed triple-core processing, the upgraded XG-8000 vision system is said to boost production and inspection performance.

• Everett Charles group offers custom connectors

  Everett Charles Technologies uses a wide range of compliant technologies to deliver custom interconnects in small to large volumes through its new Compliant Connector Group.

• Goepel adds PXI unit to LIN interface module line-up

  Goepel Electronic has expanded its range of LIN communication controllers for testing electronic control units with the introduction of the PXI 3078, a module that provides two LIN bus or K-Line interfaces and supports LIN specifications 1.3, 2.0, and 2.1.

• KLA-Tencor rolls out trio of wafer inspection systems

  The 2900, Puma 9650, and eS800 series of inspection systems address the wide range of defect issues that new materials, structures, and design rules have imposed on manufacturers of advanced chips.

• Mitsubishi model library moves to Agilent design system

  Agilent Technologies announced that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Agilent's ADS (Advanced Design System).
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