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formerly the San Jose Convention Center
Take advantage of the variety of FREE Sponsored Training Sessions presented by industry heavyweights, as part of the Expo.
OPEN and FREE to ALL attendees, the sponsored sessions grant you in-depth hands-on solutions to specific design challenges. These aren't product pitches or cleverly disguised marketing ploys; this is the real stuff that engineers want and need to get their jobs done.
Tuesday, March 27, 2012 | |
Zynq-7000 Extensible Processing Platform Design Workshop: For Software Engineers Date: Tuesday, March 27, 2012 Times: 10:00am - 11:30am; 11:00am - 12:30pm; 1:00pm - 2:30pm; 2:00pm - 3:30pm; 3:00pm - 4:30pm; 4:00pm - 5:30pm; 5:00pm - 6:30pm Location: Room B3/B4 Speaker: Glenn Steiner, Sr. Technical Manager, Xilinx, Inc. and Bill Kafig, Senior Content Development Engineer, Xilinx, Inc. Targeting the Zynq™-7000 EPP Development Platform, attendees will gain hands-on experience developing software for the Zynq-7000 EPP and learn how to use the Xilinx® Eclipse-based Software Development Kit (SDK) to compile, link, and debug software applications written in ‘C’. |
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Minimize Impact of Noise on Measurement Accuracy Date: Tuesday, March 27, 2012 Time: 11:30am - 12:30pm Location: Booth #1328 on the Expo Floor Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal. |
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Date: Tuesday, March 27, 2012 Time: 11:30am - 6:20pm Location: Room H |
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Wireless Solutions for Embedded Design Date: Tuesday, March 27, 2012 Time: 12:00pm - 1:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. Embedded engineers are increasingly being asked to add wireless communication to their systems. Each new implementation requires the designer to understand varying system needs such as cost, preformance and interoperability. This session presents alternatives to solve this problem: the interoperable ZigBee® protocol, the proprietary Microchip MiWiTM protocol and the ever present Wi-Fi®. Attendees will be shown the differences between these protocols and learn about the products and tools used to implement solutions. |
Choosing the DRAM with Complex System Considerations Date: Tuesday, March 27, 2012 Time: 12:00pm - 1:00pm Location: Room K Speaker: Todd Legler, Sr. Application Engineer/Segment Marketing Manager, Micron Technology, Embedded Solutions Group DRAM may seem like a “commodity” when selecting memory, system designers know that DRAM is at the heart of most designs and there’s more involved than just choosing a commodity device. This seminar will go beyond JEDEC trends covering design trade-offs of performance, power, and density meeting your system requirements while hitting your price and product life targets. and will help you decide the optimal solutionThis seminar provides important information when considering future DRAM technologies & trends. |
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Learn How to Isolate and Find Rare Faults Fast Date: Tuesday, March 27, 2012 Time: 12:30pm - 1:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz One of the most difficult challenges in debugging embedded systems is finding rare faults. In complex systems, faults can occur at very low rates depending on the type of system with fault rates of one per second and even lower rates. The rate at which a waveform is acquired and displayed on an oscilloscope is critical to finding faults. In this lab, we will locate and measure rare faults using a mask test and acquire and analyze a deep memory acquisition. |
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Boost Light-weight Thread Performance with Enea Linux Date: Tuesday, March 27, 2012 Time: 12:40pm - 1:40pm Location: Room L Speaker: Michael Christofferson, ENEA |
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Touch Sense and Graphics Solutions Date: Tuesday, March 27, 2012 Time: 1:00pm - 2:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. Graphical and touch based user interfaces have moved from a product differentiator to a necessity. An engaging, intuitive user interface can be the difference between product success and failure. In this session, attendees will learn about Microchip’s hardware and software solutions including projected capacitive touch and metal over capacitive. |
Set Up and Use Advanced Digital Triggers Date: Tuesday, March 27, 2012 Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Triggering is essential to capturing and measuring signals in many applications and digital oscilloscopes provide a variety of advanced triggers for this purpose. In this lab, we will set up a runt trigger on a signal with a large overshoot and investigate how to reliably trigger on this signal. In the second part of this lab, we will use a trigger sequence to capture a specific edge of clock signal relative to a data stream. |
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Spend Your Time and Money Where it Counts – Not on Replacing Obsolete Products! Date: Tuesday, March 27, 2012 Time: 1:30pm - 2:30pm Location: Room K Speaker: Cliff Smith, Technical Program Manager, Micron Technology, Embedded Solutions Group and Steven Nelson, Director of Marketing, Americas, Freescale Semiconductor industry consolidation and increased product change notifications from remaining suppliers have pushed semiconductor product obsolescence costs into uncharted space. Applications in automotive, medical, aerospace and industrial segments typically have life spans of up to 10 years or more, as well as stringent qualification and test requirements. Changes to semiconductor components generate significant obsolescence costs with either LTBs or redesigns long after engineers have moved on to new projects. |
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Date: Tuesday, March 27, 2012 Time: 1:50pm - 2:50pm Location: Room B1/B2 |
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Addressing the Complexity of Developing Software-Intensive Products Date: Tuesday, March 27, 2012 Time: 1:50pm - 2:50pm Location: Room L Speakers: Jim Brown, President, Tech-Clarity; Matthew Klassen, Director of ALM Solutions Marketing, PTC Independent research firm Tech-Clarity and PTC will present the results of a research study that explains the importance of addressing the “innovation-complexity conundrum” inherent to developing software for products that contain mechanical, electrical, and software components. Learn how leading companies take advantage of the innovation advantages of these “software-intensive” products. At the same time, understand how they can maintain (or improve) product quality, time to market, and cost despite the added complexity. Key Takeaways:
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Development Tools featuring MPLAB® X IDE Date: Tuesday, March 27, 2012 Time: 2:00pm - 3:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. A critical parameter to the success of any embedded project is the development environment. Cost, ease of use and commonality of tools are some the factors affecting the platform. This session presents Microchip’s next generation platform, MPLAB X® IDE and the tools supported by it. |
Debugging Low Speed Serial Bus Date: Tuesday, March 27, 2012 A variety of low speed serial data busses are used in embedded systems. These busses transmit commands and responses between the controller and any number of remote devices. In this lab, we will measure two such busses CAN and I2C by decoding the commands being transmitted over these interfaces and triggering on specific features of each bus protocol. |
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Connectivity Solutions featuring USB and Ethernet Date: Tuesday, March 27, 2012 Time: 3:00pm - 4:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. We live in a highly connected world. From personal devices to industrial systems, data transfer and control is critical to success. Two of the most widely deployed wired solutions are USB and Ethernet. This session helps embedded designers understand the challenges of using either of these communications standards in their applications and Microchip’s complete solution for easy integration. |
Optimize Your System Designs Using Flash Memory Date: Tuesday, March 27, 2012 Time: 3:00pm - 4:00pm Location: Room K Speaker: Bill Stafford, Director, Segment Marketing, Micron Technology, Embedded Solutions Group Walking through the maze of memory suppliers and flash architectures can be a daunting task for such a simple slice of the total design effort. This seminar will take the system designer through the path of picking the right memory device to pick based on architecture, system performance and additional feature requirements. You will be able to choose the right flash to consolidate your memory needs or figure out how to best use a combination of memory devices to optimize price, density and overall system simplicity. In the end, whether you are using NOR, NAND or phase-change memories you will have the trends and techniques for a successful platform design. |
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Date: Tuesday, March 27, 2012 Time: 3:00pm - 4:00pm Location: Room B1/B2 |
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Spectrum Analysis Using an FFT Date: Tuesday, March 27, 2012 Modern digital oscilloscopes include the ability to measure the frequency spectrum of signals using a fast Fourier transform of the acquired waveform (FFT). In addition to measuring the frequency content of the signal, the spectrum is time-aligned with the signal so that one can examine the instantaneous spectrum and correlate it with what the signal is doing in time. This powerful debugging tool will be used in this lab to identify and measure signal distortions using a combined time-frequency domain display. |
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Reducing Power and Maximizing Efficiency in Embedded Designs (co-presented by Energizer) Date: Tuesday, March 27, 2012 Time: 4:00pm - 5:00pm Location: Booth #1116 Presented by: Adam Jakubiak, Technical Services Engineer, Energizer® As more electronic devices become battery powered, conserving that power has become paramount. Energizer® and Microchip have teamed up to develop solutions for, and educate designers about, eXtreme Low Power (XLP) microcontrollers (MCUs), batteries, and extending battery life. In this presentation, Energizer will discuss various battery types, key characteristics, target applications and case studies of embedded designs with battery power. Market demands and regulatory requirements are forcing higher efficiency and performance be derived from virtually every electronic product whether battery or line powered. These demands require designers to continually optimize all areas of product design including component power consumption, efficient power transfer and sophisticated control algorithms. This session will show how Microchip can help solve these issues with our XLP eXtreme Low Power microcontrollers, high efficiency single cell switching regulator, energy harvesting solutions, high efficiency digital power and motor control solutions and more. |
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Date: Tuesday, March 27, 2012 Time: 4:30pm - 5:30pm Location: Room K |
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Minimize Impact of Noise on Measurement Accuracy Date: Tuesday, March 27, 2012 Time: 4:30pm - 5:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal. |
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Smart Energy Monitoring, Metering and Control Date: Tuesday, March 27, 2012 Time: 5:00pm - 6:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. Government regulations and the cost of building power generating systems are two forces driving a more efficient power distribution system. To achieve the goal of enabling the smart grid, an integrated system for power measurement, monitoring, communication and control is essential. This session presents Microchip’s solutions from energy measurement devices through communications. |
Set Up and Use Advanced Digital Triggers Date: Tuesday, March 27, 2012 Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Triggering is essential to capturing and measuring signals in many applications and digital oscilloscopes provide a variety of advanced triggers for this purpose. In this lab, we will set up a runt trigger on a signal with a large overshoot and investigate how to reliably trigger on this signal. In the second part of this lab, we will use a trigger sequence to capture a specific edge of clock signal relative to a data stream. |
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Hands-On Class includes a FREE PICkit™ 3 & One PIC® Microcontroller Demo Board - Control Your Embedded Design Cost – Simplify, Reduce, Reuse Date: Tuesday, March 27, 2012 Time: 6:00pm - 7:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. This hands-on class will demonstrate the ease with which you can migrate your designs among Microchip’s 8, 16 and 32 bit PIC® microcontroller families. Discover the power and simplicity of using just one development platform, common peripherals and reusable software libraries. Please bring your own laptop to this session. Attendees will receive a free PICkit(tm) 3 In-Circuit Debugger AND a One PIC® Microcontroller Platform Demo Board that will be used during the session for exercises. This board contains an 8, 16 and 32 bit PIC® Microcontroller that can operate the LCD, LED and capacitive touch pads. Additionally, the board has a dedicated Real-Time Calendar Clock circuit and is able to run from a single AAA Energizer® Ultimate Lithium battery. REGISTRATION Instructions: Space is limited for the Hands-On Class! Registration is first-come, first-serve. To Register, you must contact Microchip at ESC@microchip.com. Subject Line: Hand-On Class at ESC. |
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Wednesday, March 28, 2012 | |
Rational Solution for Electronics Systems and Software Engineering Date: Wednesday, March 28, 2012 Time: 8:45am - 10:15am Location: Room D Speaker: Manohar Rao, Rational Specialty Architect, IBM Rational As the electronic industry creates more software intensive systems, the execution of systems and software engineering takes a larger role in driving the quality and success of the product. A set of core processes underlies both systems and software engineering. These processes include requirements management, architecture and design, change and configuration management, and test and quality management. This presentation discusses the IBM Rational® Solution for Systems and Software Engineering which supports the collaboration, workflows, tasks, and management of the work products essential to systems and software engineering. |
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Zynq-7000 Extensible Processing Platform Design Workshop: For Hardware Engineers Attendees of this workshop will gain hands-on experience using Xilinx Platform Studio to customize the processor system including DDR memory controller and common peripherals like Ethernet MAC, USB, SD/SDIO, GPIO and UART. Attendees will also add a programmable logic peripheral, and export the design to the Software Development Kit (SDK) where they will test the hardware design with a software application. |
Model-Driven Development with Safety, Security, and Reliability Date: Wednesday, March 28, 2012 Time: 10:15am - 11:15am Location: Room D Speaker: Bruce Douglass, Chief Evangelist, IBM Rational Software is assuming an ever-increasing role in the control of mission critical equipment. This applies to fly-by-wire aircraft, nuclear power plants, industrial control systems, and medical equipment. Despite this trend toward relying on software to provide safe and effective control of hazardous materials and systems, very few opportunities exist for engineers to get training and education in even the basic concepts of dependability engineering. Dependability has three primary aspects – safety, reliability, and security. This class introduces the architectures of safe, reliable, and secure systems, particularly those that depend heavily on software. |
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Minimize Impact of Noise on Measurement Accuracy Date: Wednesday, March 28, 2012 Time: 11:30am - 12:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal. |
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Date: Wednesday, March 28, 2012 Time: 11:30am - 5:10pm Location: Room H |
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Date: Wednesday, March 28, 2012 Time: 12:00pm - 1:00pm Location: Room K |
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Reducing Power and Maximizing Efficiency in Embedded Designs (co-presented by Energizer) Date: Wednesday, March 28, 2012 Time: 12:00pm - 1:00pm Location: Booth #1116 Presented by: Adam Jakubiak, Technical Services Engineer, Energizer® As more electronic devices become battery powered, conserving that power has become paramount. Energizer® and Microchip have teamed up to develop solutions for, and educate designers about, eXtreme Low Power (XLP) microcontrollers (MCUs), batteries, and extending battery life. In this presentation, Energizer will discuss various battery types, key characteristics, target applications and case studies of embedded designs with battery power. Market demands and regulatory requirements are forcing higher efficiency and performance be derived from virtually every electronic product whether battery or line powered. These demands require designers to continually optimize all areas of product design including component power consumption, efficient power transfer and sophisticated control algorithms. This session will show how Microchip can help solve these issues with our XLP eXtreme Low Power microcontrollers, high efficiency single cell switching regulator, energy harvesting solutions, high efficiency digital power and motor control solutions and more. |
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Learn How to Isolate and Find Rare Faults Fast Date: Wednesday, March 28, 2012 Time: 12:30pm - 1:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz One of the most difficult challenges in debugging embedded systems is finding rare faults. In complex systems, faults can occur at very low rates depending on the type of system with fault rates of one per second and even lower rates. The rate at which a waveform is acquired and displayed on an oscilloscope is critical to finding faults. In this lab, we will locate and measure rare faults using a mask test and acquire and analyze a deep memory acquisition. |
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Connectivity Solutions featuring USB and Ethernet Date: Wednesday, March 28, 2012 Time: 1:00pm - 2:00pm Location: Booth #1116 Presented by: Sr. Technical Training Engineer, Microchip Technology Inc. We live in a highly connected world. From personal devices to industrial systems, data transfer and control is critical to success. Two of the most widely deployed wired solutions are USB and Ethernet. This session helps embedded designers understand the challenges of using either of these communications standards in their applications and Microchip’s complete solution for easy integration. |
Agile Development of Software-Intensive Systems Date: Wednesday, March 28, 2012 Time: 1:00pm - 2:00pm Location: Room D Speaker: Tim Barrios, Client Technical Specialist, IBM Rational Complex software-intensive systems historically follow a traditional, Big Design Up Front development process. Many organizations use agile methods to better accommodate stakeholder feedback, uncertainty, and change. Blending traditional and agile approaches is an emerging challenge as large, complex systems begin adopting agile practices. This presentation first contrasts traditional and agile development, discussing their relative strengths and weaknesses. Next, it shows how to add agility to complex software-intensive systems while avoiding common pitfalls. |
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Set Up and Use Advanced Digital Triggers Date: Wednesday, March 28, 2012 Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz Triggering is essential to capturing and measuring signals in many applications and digital oscilloscopes provide a variety of advanced triggers for this purpose. In this lab, we will set up a runt trigger on a signal with a large overshoot and investigate how to reliably trigger on this signal. In the second part of this lab, we will use a trigger sequence to capture a specific edge of clock signal relative to a data stream. |
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Optimize Your System Designs Using Flash Memory Date: Wednesday, March 28, 2012 Time: 1:30pm - 2:30pm Location: Room K Speaker: Bill Stafford, Director, Segment Marketing, Micron Technology, Embedded Solutions Group Walking through the maze of memory suppliers and flash architectures can be a daunting task for such a simple slice of the total design effort. This seminar will take the system designer through the path of picking the right memory device to pick based on architecture, system performance and additional feature requirements. You will be able to choose the right flash to consolidate your memory needs or figure out how to best use a combination of memory devices to optimize price, density and overall system simplicity. In the end, whether you are using NOR, NAND or phase-change memories you will have the trends and techniques for a successful platform design. |
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Cost-Effective Code Reuse through Architectural Analysis Date: Wednesday, March 28, 2012 Time: 2:00pm - 3:00pm Location: Room D Speaker: Edmund Mayer, Rational Systems Practice Leader, IBM Rational New development projects often start with existing source code. Effective code reuse starts wi |